Key Parameters:

Base Vacuum:  1×10-10 Torr
Sample temperature range： 120K-1800K
Resolution in LEEM:  ～50 nm (16% / 84% criteria)
Resolution in PEEM:  ～110 nm (16% / 84% criteria)

Functions & Applications

The illuminating and imaging columns in Low Energy Electron Microscope (LEEM-IV) are assembled on a 10 in. flange. As a useful surface probe technique, there are basically three operation modes: low energy electron microscopy (LEEM), low energy electron diffraction (LEED), and photoemissiom electron microscopy (PEEM) in it. Dynamic processes such as surface transformations, epitaxial growth, adsorption and desorption, and chemical reactions on the surface can be recorded in real time. There are different choices of light sources for photoelectron excitation, such as mercury discharge UV lamp, and femtosecond laser. The various light sources widely extended the study areas of LEEM-IV, which include: observing changes in local work function of the sample surface in-situ and in real time, single- and multiple-photon photoemission, excitation and propagation of surface plasmons, etc.